X-rays can damage ICs. While searching for
information
on possible risks to electronics from x-ray security
screening, I encountered a second-hand reference to a
study to determine the safest X-ray wavelengths and
exposure for nondestructive testing of
high-reliability
ICs. X-rays can inject faults into the silicon
lattice,
which degrade the quality of the transistors. I think
the
exposure that can be tolerated is affected by geometry
(e.g., transistor size), so it might not be as much of
an
issue for older electronics as it is for newer stuff.
Anybody know more?
--Bill