2 Sep
2007
2 Sep
'07
2:14 p.m.
What I'm wondering is if anyone knows how I can
prematurely kill a
TTL device or simulate static failure. I'd like to try to test how
thoroughly the programmer tests the chips. It can't tell the
difference between a 7410 and 7412, but that isn't too important for
knowing the chip works (mostly)
IIRC, the 7410 is a triple 3-input NAND gate (totem pole outputs), the
7412 is the open-collector version. If it can't tell those apart, how can
it reject a 7410 where one or more of the 'top' transsitors in the totem
pole output have failed? And yes, I've had that failure mode (actually in
74H series devices).
FOr that matter can it tell if 3-state outputs are working correctly
(rather than, say, being stuck high when they should be disabled)?
If you twant to simulate simple failures, how about wiring the IC to a
DIL header with one or more pins open-circuited (and maybe tying pins
that should be outputs to ground rather than to the output pin of the chip).
-tony